METHOD AND DEVICE FOR USE IN DC PARAMETRIC TESTS

专利名称：METHOD AND DEVICE FOR USE IN DC

PARAMETRIC TESTS

发明人：GORDON, W. ROBERTS,CLARENCE, K. , L.

TAM

申请号：AU2003222702申请日：20030429公开号：AU2003222702A1公开日：20031117

摘要：A system and device suitable for use in performing a DC parametric test on anexternal load is provided. The device may be configured to apply a desired voltage orcurrent to the external load. The circuit device receives a forcing parameter signal at aninput (202) and releases at an output a signal approximating the forcing parameter signalto the external load. The circuit device includes a first circuit segment between the inputand the output having a search unit (199), an intermediate voltage point (214) and aninternal load (216) between the intermediate voltage point and the output. A secondcircuit segment connected in a feedback arrangement with the first circuit segmentprovides the search unit with the voltage at the output. The search unit is adapted forgenerating a second voltage signal on the basis of the forcing parameter signal and thefirst voltage signal received and to apply the second voltage signal to the intermediatevoltage point. The application of second voltage signal to the intermediate voltage pointcauses a change in either one of the voltage signal or the current signal at the outputsuch that a signal approximating the forcing parameter signal is caused at the output. Acurrent measuring circuit adapted for providing a measure of the current at the external

load suitable for use with a voltage generating circuit device is also provided.

申请人：MCGILL UNIVERSITY

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