专利名称：Method and device for inspecting
circumferentially conducting materials
发明人：Susan N. Vernon,Stephen S. Lane申请号：US07/374212申请日：19890630公开号：USH0000879H1公开日：19910101
摘要：A device for inspection by eddy current methods of materials exhibitingcumferential conductivity. This device finds application for the inspection of filament-wound carbon fiber reinforced composites which do not usually have sufficient
conductivity in the axial direction to allow inspection by conventional surface probes whilestill providing the desired resolution. This device is also useful in inspecting thick-walledcircumferentially conductive materials, including metal, where their thickness wouldrequire a surface probe of such diameter as to be impractical.
代理人：John D. Lewis,Kenneth E. Walden
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