专利名称：Capacitive media resistivity, dialectic
constant, and thickness sensor
发明人：Phillip R. Luque申请号：US10170764申请日：20020612
公开号：US20030231024A1公开日：20031218
专利附图：
摘要：This invention relates to a method and apparatus for measuring the resistivity,dialectic constant, and thickness of a media. Such structures of this type, generally,employ a pair of interdigital capacitive sensors that contact only one side of the media.
An AC voltage is used to measure capacitance between the interdigital capacitive sensors.The capacitance readings from the sensors can be combined to compute the dialecticconstant and the thickness of the media.
申请人：LUQUE PHILLIP R
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