专利名称：Apparatus for inspecting the coplanarity of
leaded surface mounted electroniccomponents
发明人：Ben S. Stillman申请号：US07/051889申请日：19870518公开号：US04754555A公开日：19880705
摘要：Apparatus for inspecting the coplanarity of surface mounted integrated circuitcomponents including a housing for containing necessary electrical circuitry and
indicators, a socket assembly for receiving one electronic circuit package at a time and forcontacting each lead of the package that is within acceptable coplanarity limits, andmeans for indicating those leads that are out of predetermined limits. The device alsoincludes a spring loaded plunger assembly for facilitating insertion of a packaged ICdevice into the inspection socket and for applying appropriate loading force to the topsurface thereof.
申请人：ADCOTECH CORPORATION
代理机构：Rosenblum, Parish & Bacigalupi
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